Feature
Prodest volucris probe probator;
Ieiunium examinis progressionem;inferiores sumptus examinis modos;flexibilitatem celeriter changeover;et ieiunare feedback ad designers in prototypo Phase.
6-clavum vel 8-clavum cubile volans exploratores probatores duplici postesque probatione uti possunt, sicut lecti clavorum probatio, salvis tabula flippingis temporis.
Novae volatilis specillum probatores ad munera mollis accessus adhibentur, et vis fontis specilli fons ad 10g (0.1N) reduci potest.Etsi tempus experimentum leviter augetur, nota punctura fere invisibilis est.
Ideo, cum tradito ICT comparatum, tempus requisitum ad specillum volandi probationis plus est quam reducendo totum experimentum temporis compensatur.
Beneficia volatilis explorandi ratio utendi incommoda praeponderante.Exempli gratia, talis ratio processum comitialis praebet ut productionem inciperet paucis horis post fasciculum CAD acceptum.Ideo tabulae prototypum explorari possunt horae post conventum, dissimilis ICT, ubi summus sumptus experimentorum progressus et fixtures processum dierum vel etiam mensium morari potest.Volans speculatoria systemata explorationem visualem inspectionem temporis "primi articuli" novarum productorum minuit, quod magni momenti est quia prima tabula saepe experimentum notarum reliquorum UUTs determinat.
【Res maiora】
Octo rimatur in duplici parte est optimum pretium
Princeps accurate (MV sarcina suscepit)
Subtilitas lineares rail systema altum re- positioning accuracy
Online / Inline tradenda suscepit
Horizonal transmissio
Static LCRD test confirmavit
Detail Image
Specifications
| Exemplar | TY-8Y | |
| Praecipua Spec | Minimum Chip | 01005（0.4mm x 0.2mm） |
| Min Compenent Pin Spacing | 0.2mm | |
| Min Contact Pad | 0.15mm | |
| Probes | 4 Capitula (Top) + 4 Capitula (Bottom) | |
| Specillum vis elastica | 120g（Default | |
| Probe Rated Stroke | 1.5mm | |
| Testile punctum types | Test puncta, Pads, Fabrica Dlectrodes Connectors, Irregular Components | |
| Testis velocitate | Max 25 Steps/Sec | |
| Repeatability | ±0.005mm | |
| Cingulum excelsum | 900±20mm | |
| Cingulum Wideth | 50mm ~ 630mm | |
| Semita width temperatio | Auto | |
| Inline Modus Offline Modus | Sinistra (recte) In iure (Left) Out In reliquit ex reliquit | |
| Optica | Camera | 4 LAETUS Camerae, 12M Pixels |
| Laser Displacement Sensor | 4 Sets | |
| Test Area | Max Test Area | 640mm x 600mm |
| Min Test Area | 60mm x 50mm | |
| TOP Clearence | ≤50mm | |
| Bot Clearence | ≤50mm | |
| Tabula Edge | ≥3mm | |
| Crassitudo | 0.6mm ~ 6mm | |
| Max PCBA Pondus | 10kg | |
| Motus Morbi laoreet | Probe Redi Altitudo | Programmed |
| Specillum Pressing Profundum | Programmed | |
| Probe Mollis Landing | Programmed | |
| Z distantia | -3mm~ 53mm | |
| XY/Z Acceration | Max 3G / Max 20G | |
| XYZ Coegi | Motor linearis | |
| XYZ Mensura | Linearibus scalae | |
| XY Lead Rail | P-Grade cura duce rail | |
| Testis Facultas | Resistors | 1mΩ ~ 1GΩ |
| Capacitors | 0,5pF~1F | |
| Inductores | 0.5uH~1H | |
| Diocles | Ita | |
| Diode Zener | 40V | |
| BJT | Ita | |
| Nullam | 40V | |
| FETs | Ita | |
| DC Constans Current Source | 10nA~1A | |
| DC Constant Voltage Source | 0 ~ 40V | |
| AC Constant Current Source | 100 ~ 500mVrms(200hz~ 1Mhz) | |
| Panel Test | Ita | |
| 2D Barcode | Ita | |
| PCBA Deformationis Compensation | Ita | |
| MES Connection | Ita | |
| DUXERIT Testis | Option | |
| Open Pin | Option | |
| In tabula programing | Option | |
| Vayo DFT (6 CAD) | Option | |
